Unconventional magnetization of Fe3O4 thin film grown on amorphous SiO2 substrate
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چکیده
منابع مشابه
Morphology of Thin Aluminum Film Grown by DC Magnetron Sputtering onto SiO2 on Si(100) Substrate
The morphology and grown mechanism of aluminum films from 3nm to 30nm in thickness onto thermal SiO2 on Si(100) substrates have been studied by atomic force microscopy and TCR measurement. The thin films prepared by dc magnetron sputtering at 450°C is composed of islands of aluminum. The island density, distribution of island size, height, and shape are studied.
متن کاملA sensitive enzymeless hydrogen-peroxide sensor based on epitaxially-grown Fe3O4 thin film.
A novel and facile approach has been developed to synthesize thin films of magnetite (Fe(3)O(4)) with epitaxial needle-like columnar grains on titanium nitride (TiN) buffered substrate using DC magnetron reactive sputtering. TiN buffer layer was first sputtered onto a substrate at 550 °C as a preferable substrate for growth following sputtering of epitaxial crystalline Fe(3)O(4) at 300 °C. The ...
متن کاملStructure of thin SiO2 films grown on Mo„112..
Ultra-thin SiO2 films were prepared by evaporating Si onto a Mo~112! surface followed by oxidation and annealing up to 1200 K. The surface structure and film quality were investigated by low-energy electron diffraction ~LEED!, Auger spectroscopy ~AES!, and high-resolution electron energy loss spectroscopy ~HREELS!. A well-ordered, monolayer Mo(112)-c(232)-SiO2 structure was characterized by HRE...
متن کاملInvestigation of strain-relaxed SiGe thin film grown on ion-implanted Si compliant substrate
Si1 xGex thin films on the Ar + ion-implanted Si substrates with different implantation energy (30 keV, 40 keV and 60 keV) at the same implantation fluence (3 · 10 cm ) were grown by ultra high vacuum chemical vapor deposition (UHVCVD). Various characterization technologies were used to characterize these Si1 xGex films. Investigations by Rutherford backscattering spectroscopy/channeling (RBS/C...
متن کاملOptical properties of epitaxial BiFeO3 thin film grown on SrRuO3-buffered SrTiO3 substrate
The BiFeO3 (BFO) thin film was deposited by pulsed-laser deposition on SrRuO3 (SRO)-buffered (111) SrTiO3 (STO) substrate. X-ray diffraction pattern reveals a well-grown epitaxial BFO thin film. Atomic force microscopy study indicates that the BFO film is rather dense with a smooth surface. The ellipsometric spectra of the STO substrate, the SRO buffer layer, and the BFO thin film were measured...
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ژورنال
عنوان ژورنال: AIP Advances
سال: 2016
ISSN: 2158-3226
DOI: 10.1063/1.4954035